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Upcoming Deadlines

Regular Paper Submission: July 31, 2017
Regular Paper Authors Notification: October 18, 2017
Regular Paper Camera Ready and Registration: November 1, 2017
The purpose of the International Conference on Model-Driven Engineering and Software Development, MODELSWARD 2018, is to provide a platform for researchers, engineers, academicians as well as industrial professionals from all over the world to present their research results and development activities in using models and model driven engineering techniques for Software Development. Model-Driven Development (MDD) is an approach to the development of IT systems in which models take a central role, not only for analysis of these systems but also for their construction. MDD has emerged from modelling initiatives, most prominently the Model-Driven Architecture (MDA) fostered by the Object Management Group (OMG). In the scope of MDA, a couple of technologies have been developed that became the cornerstones of MDD, like metamodelling and model transformations. MDD relies on languages for defining metamodels, like the Meta-Object Facility (MOF) and Ecore (developed in the scope of the Eclipse Modelling Framework), and transformation specification languages like QVT and ATL.

Conference Chair

Bran SelicMalina Software Corp., Canada

PROGRAM CO-CHAIRS

Luis Ferreira PiresUniversity of Twente, Netherlands
Slimane HammoudiESEO, MODESTE, France

LOCAL CHAIR

Leonel NóbregaUniversity of Madeira, Portugal

Keynote Speaker

Franck BarbierUniversity of Pau, France

Doctoral Consortium

Chair: Fernando Brito e Abreu
Submission: November 9, 2017
Submission: November 9, 2017

Industrial Track

 

All papers presented at the conference venue
will be available at the SCITEPRESS Digital Library


It is planned to publish a short list of revised and
extended versions of presented papers with Springer
in a CCIS Series book (final approval pending)

In Cooperation with:

EAPLS   AIS SIGMAS   ITHEA® ISS  

 

Proceedings will be submitted for indexation by:

DBLP   Thomson   INSPEC   EI   SCOPUS  

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